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* Products List
- CCD Beam Profiler (BeamOn HR)
- Knife-Edge Beam Profiler (BeamAnalyzer)
- CCD Beam Profiler (BeamOn)
- Microscopic beam Analyzer (uBeam)
- M2 Measurement (M2 Beam)
- Beam Divergence Measurement (FOCUSGAGE)
- Goniometric Radiometer for fiber/diode (FiberAlyzer)
- Optical Beam Position/Power Measurement (SpotOn series)
- Large Aperture Beam Positoning System (SpotOn LA)
- AlignMeter
- Video Microscope Measurement on your PC (uVideoScope)
- Low Light Dual Mode Camera
- Resolving Collimator (TargetOn)

There are three types of beam-profiling instrumentation: CCD camera-based systems, knife-edge scanners, and slit scanners.
CCD camera systems, suitable for pulsed or cw lasers, instantly record and display the entire optical pattern that impinges on the detector surface.
Knife-edge and slit profilers generate a calculated profile by mechanically moving a slit aperture or knife-edge across the beam. These systems provide better resolution than CCD cameras, but the calculated profile makes more assumptions about the beam shape. They are designed for use with cw and high repetition-rate (e.g., >100 kHz) pulsed lasers.
 
CCD Beam Profiler

- Complete system includes: CCD camera, PCI card, ND 4.0 filtter, Software, Mounting block
- Silicon CCD Sensor: Array: 1360 x 1024, 4.65-mm square pixels, Dimensions: 6.32 x 4.76mm
- Wavelength Range: 350 nm to 1150 nm
- Position Measurement: Range: 6.3(H)x4.7(V) mm, Accuracy: < 1-㎛ processing accuracy
- Data Analysis: Pass/fail, average (up to 50 samples), min., max., mean, standard deviation (up to 4096 samples),
Gaussian and top-hat percent fit
 
Scanning Slit Beam Profiler(Beam'R)

Beam'R is a versatile laser beam profiling system for product development, QA and production assembly and test. It provides orthogonal, two-dimensional profiles of laser beams as small as 0.5 μm in diameter and as large as 3 mm in diameter with four integrating slits. Beam'R comprises a compact measurement head, a single PC card and Windows 98, ME, NT, and 2000 compatible software. Detectors are available to cover the range from 190 nm to 4 μm.
- Detector Wavelength Range: Silicon: 190 - 1175nm, Indium Gallium Arsenide: 800-1750nm,
Indium Arsenide: 1000-3500 nm
- Display: x-y position, beam profile with zoom for ×1 to ×32
- Measurement Analysis: Pass/Fail, running average (2-100 samples), statistics (min., max., mean, standard deviation)
 
Scanning Slit Beam Profiler(BeamScope)

The BeamScope™ is a versatile linear scanner designed to measure beam diameters as small as 0.5 μm or as large as 25 mm. It features a unique retractable probe that enables it to profile two orthogonal axes simultaneously and then be removed completely from the beam path. BeamScope heads are available with silicon, germanium, and indium-arsenide detectors that collectively cover the wavelength range from 190 nm to 4 μm.
- Measurements: cw or pulsed (>500 Hz) beam profile, diameter, centroid, geometrical center, ellipticity, beam
divergence
- Detector Wavelength Range: Silicon: 190 - 1100nm, Indium Gallium Arsenide: 800-1800nm,
Indium Arsenide: 1500-4000nm, II-VI Detector: 4-12 μm
- Display: 2-dimensional profiles and 3-dimensional reconstructions, pass/fail color indication on measured parameters,
averages and standard deviations of measured parameters
 
Scanning Slit Beam Profiler(BeamMap)

The BeamMap™ is a complete laser-beam focusing, diagnostic, alignment instrument for tightly focused beams. It is ideal for product development, quality assurance, and production assembly and testing. Features include real-time x-y-z focus, angular alignment, M2 (quality factor), and relative output power, all in a single, compact measurement head.
- Detector Wavelength Range: Silicon: 190 - 1150nm, Indium Gallium Arsenide: 800-1750nm
- Display: x-y position, focus, axial misalignment, beam profile with zoom for ×1 to ×32
- Measurement Analysis: Pass/Fail, running average (2-100 samples), statistics (min., max., mean, standard deviation)
 
Scanning Slit Beam Profiler(BeamMap ColliMate)

The new BeamMap ColliMate extends BeamMap profiler technology to collimated beam measurement dramatically simplifying the measurement of collimation and alignment and the adjustment of multiple assemblies to the same axes. In the collimate head, a rotating puck carries x-y slit pairs in multiple planes spaced along the z-axis (the direction of propagation).
- Detector Wavelength Range: Silicon: 190 - 1150nm, Indium Gallium Arsenide: 800-1750nm
- Display Graphics: x-y profiles and centroid, 1× to 16× zoom, M2, focus, divergence, pointing
- Measurement Analysis: Pass/Fail, running average (2-100 samples), statistics (min., max., mean, standard deviation)
 
Scanning Knife-Edge Profiler(BeamAlyzer 3-Blade Tomographic Profiler)

The three-blade scanning system is ideal for scanning beams as small as 3 μm and as large as 5 mm. Like all scanning slit and knife-edge profilers, to reconstruct three-dimensional beam profiles from the two-dimensional data, it must make assumptions about the beam. In many cases this is adequate, but for the best three-dimensional reconstructions available, the seven-blade detector heads are recommended. No computer is required, but a monitor and mouse is needed for 3 dimensional displays. Data may be exported using the standard RS-232 or USB port.
- Detector Wavelength Range: Silicon: 400 - 1100nm, UV Silicon: 190 - 1100nm, InGaAs: 800 - 1800nm
- Knife-Edge Apertures: 3
 
Scanning Knife-Edge Profiler(Super BeamAlyzer 7-Blade Tomographic Profiler)

The seven-blade SuperBeamAlyzer uses tomographic reconstruction to develop the most accurate three-dimensional intensity profiles possible from a scanning slit or knife-edge profiler. The SuperBeamAlyzer measures beams from 15μm to 9mm. No computer is required, but a monitor and mouse is needed for 3 dimensional displays. Data may be exported using the standard RS-232 or USB port.
- Detector Wavelength Range: Silicon: 400 - 1100nm, UV Silicon: 190 - 1100nm, InGaAs: 800 - 1800nm
- Knife-Edge Apertures: 7
 
M2 Meter(BeamScope with M2 Attachment)

The BeamScope™ is a versatile linear scanner designed to measure beams as small as 0.5 μm in diameter. When equipped with the optional M2 attachment (13 SKD 611), it can determine the quality factor of beams directly from a laser, and meets all of the critera set forth by the International Standards Organization for M2 measurement.
- Beam Diameter: 0.5 μm to 25 mm (depending on slit configuration and head)
- Measurements: cw or pulsed (>3000 Hz) beam profile, diameter, centroid, geometrical center, ellipticity, beam
divergence
- Diameter Profiles: Gaussian, second moment, knife-edge, and top hat
- Display: 2-dimensional profiles and 3-dimensional reconstructions, pass/fail color indication on measured parameters,
averages and standard deviations of measured parameters
- Detector Wavelength Range: Silicon: 190-1100nm, Germanium: 800-1800nm, Indium-arsenide: 1500-4000nm,
II-VI Detector: 4-12 μm
 
BeamAnalyzer Accessories
(BeamAnalyzer Rotation Mount)

BeamAnalyzer Accessories
(Fiber Adaptor)